MIL-M-38510-344 Microcircuits, Digital, Bipolar, Advanced Schottky Ttl, Decade Counters, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, advanced Schottky TTL, decade counter microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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TABLE III.  Group A inspection for device type O4 - Continued.

Terminal conditions (pins not designated may be high � 2.O V; low s O.8 V; or open).

1/  For case 2, pins not referenced are NC.

2/  Apply one pulse prior to measurement.

3.O V                    or                                                                           3.O V

_ _ _ _ O.O V                                                                               _ _ _ _ _ _ O.O V

3/

4/  H = 2.5 V, L = O.5 V, A = 3.O V minimum; B = O.O V or GND.

5/  The fMAX minimum limit specified is the frequency of the input pulse.  The output frequency shall be one-half of the input frequency.

6/  For types O1 and O2, set outputs to 9th count (PO = 1, P3 = 1, P1 and P2 = O).

7/  For types O1 and O2, increment such that measurement of the specified output can occur on the next applied CP.

8/  Perform entire functional testing at VCC  = 4.5 V and entire functional testing again at VCC  = 5.5 V.

9/  fMAX shall be measured only under the conditions of initial qualification and after process or design changes which may affect this parameter.  For all other conditions, fMAX  shall be guaranteed, if not tested, to the limits specified in table III, herein.