TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high � 2.0 V; low s 0.8 V; or open).
Subgroup |
Symbol |
MIL-STD- 883 method |
Cases R, S, 2 |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
18 |
19 |
20 |
Measured terminal |
Test limits |
Unit |
|
Test no. |
A1 |
B1 |
A0 |
B0 |
S0 |
S1 |
S2 |
F0 |
F1 |
GND |
F2 |
F3 |
G |
P |
Cn |
B3 |
A3 |
B2 |
A2 |
VCC |
Min |
Max |
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9 Tc = 25°C |
tPHL10 |
3003 Fig. 4 " |
371 |
GND |
2.7 V |
GND |
2.7 V |
IN |
2.7 V |
GND |
GND |
OUT |
GND |
2.7 V |
GND |
2.7 V |
GND |
5.0 V |
S0 to P |
3.0 |
13.5 |
ns |
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372 |
2.7 V |
GND |
2.7 V |
GND |
2.7 V |
IN |
GND |
" |
" |
" |
GND |
2.7 V |
GND |
2.7 V |
" |
S1 to P |
" |
" |
" |
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373 |
GND |
GND |
GND |
GND |
2.7 V |
GND |
IN |
" |
" |
" |
GND |
GND |
GND |
GND |
" |
S2 to P |
" |
" |
" |
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10 |
Same tests as subgroup 9, except TC = +125°C and use limits from table I. |
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11 |
Same tests as subgroup 10, except TC = -55°C and use limits from table I. |
1/ IIL limits (mA) min/max values for circuit shown:
Parameter |
Test no. |
A |
B |
C |
IIL1 |
48 - 50 |
-0.12/-0.6 |
-0.12/-0.6 |
|
IIL2 |
51 - 59 |
-0.12/-2.4 |
-0.12/-2.4 |
2/ H � 1.5 V, L s 1.5 V ; A = 2.5 V, B = 0.5 V.
3/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V.
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