TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high � 2.0 V or low s 0.8 V or open).
Subgroup |
Symbol |
MIL-STD- 883 method |
Cases A,B,C,D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Limits |
Unit |
|
Case 2 1/ |
2 |
3 |
4 |
6 |
8 |
9 |
10 |
12 |
13 |
14 |
16 |
18 |
19 |
20 |
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Test no. |
A |
E |
F |
G |
H |
I |
GND |
y |
J |
K |
B |
C |
D |
VCC |
Min |
Max |
|||||
10 |
tPHL |
3003 Fig. 3 |
86-96 |
Same tests and terminal conditions as for subgroup 9, except TC = +125°C |
1.0 |
6.5 |
ns |
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tPLH |
" |
97-107 |
1.0 |
8.0 |
ns |
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11 |
Same tests, terminal conditions and limits as for subgroup 10, except TC = -55° C. |
1/ Pins not referenced (i.e., 1, 5, 7, 11, 15, and 17) are N/C.
2/ IIL limits shall be as follows:
Parameters |
Min/Max limits in mA for circuit |
||
A |
B |
C |
|
IIL |
-.25/-.60 |
-.03/-.60 |
-.03/-.60 |
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