TA8LE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high 2.0 v, low σ 0.7 v, or open).
Subgroup |
Symbol |
MIL-STD- 883 method |
Cases A,8,C,D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Limits |
Unit |
|
Cases X, 2 1/ |
2 |
3 |
4 |
6 |
8 |
9 |
10 |
12 |
13 |
14 |
16 |
18 |
19 |
20 |
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Test no. |
1A |
18 |
1Y |
2A |
28 |
2Y |
GND |
3Y |
3A |
38 |
4Y |
4A |
48 |
vCC |
Min |
Max |
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1 Tc = 25°C |
I I L |
3009 " " " " " " " |
45 |
0.4 v |
5.5 v |
5.5 v |
5.5 v |
GND |
5.5 v |
5.5 v |
5.5 v |
5.5 v |
5.5 v |
1A |
3/ |
3/ |
mA |
||||
46 |
5.5 v |
0.4 v |
5.5 v |
" |
" |
" |
" |
" |
" |
" |
18 |
" |
" |
" |
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47 |
" |
5.5 v |
0.4 v |
" |
" |
" |
" |
" |
" |
" |
2A |
" |
" |
" |
|||||||
48 |
" |
" |
5.5 v |
0.4 v |
" |
" |
" |
" |
" |
" |
28 |
" |
" |
" |
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49 |
" |
" |
" |
5.5 v |
" |
0.4 v |
" |
" |
" |
" |
3A |
" |
" |
" |
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50 |
" |
" |
" |
" |
" |
5.5 v |
0.4 v |
" |
" |
" |
38 |
" |
" |
" |
|||||||
51 |
" |
" |
" |
" |
" |
" |
5.5 v |
0.4 v |
" |
" |
4A |
" |
" |
" |
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52 |
" |
" |
" |
" |
" |
" |
" |
5.5 v |
0.4 v |
" |
48 |
" |
" |
" |
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ICCH |
3005 |
53 |
" |
" |
" |
" |
" |
" |
" |
5.5 v |
5.5 v |
" |
vCC |
6.2 |
" |
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ICCL |
3005 |
54 |
GND |
GND |
GND |
GND |
" |
GND |
GND |
GND |
GND |
" |
vCC |
9.8 |
" |
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2 |
Same tests, terminal conditions and limits as for subgroup 1, except TC = +125°C and vI C tests are omitted. |
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3 |
Same tests, terminal conditions and limits as for subgroup 1, except TC = -55°C and vI C tests are omitted. |
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9 Tc = 25°C |
tPHL |
3003 Fig. 3 " " |
55 |
IN |
GND |
OUT |
GND |
5.0 v |
1A to 1Y |
2 |
20 |
ns |
|||||||||
56 |
IN |
GND |
OUT |
" |
" |
2A to 2Y |
" |
" |
" |
||||||||||||
57 |
" |
OUT |
IN |
GND |
" |
3A to 3Y |
" |
" |
" |
||||||||||||
58 |
" |
OUT |
IN |
GND |
" |
4A to 4Y |
" |
" |
" |
||||||||||||
tPLH |
" " " " |
59 |
IN |
GND |
OUT |
" |
" |
1A to 1Y |
" |
" |
" |
||||||||||
60 |
IN |
GND |
OUT |
" |
" |
18 to 2Y |
" |
" |
" |
||||||||||||
61 |
" |
OUT |
IN |
GND |
" |
1C to 3Y |
" |
" |
" |
||||||||||||
62 |
" |
OUT |
IN |
GND |
" |
1D to 4Y |
" |
" |
" |
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10 Tc = 125°C |
tPHL |
" " |
63 to 66 |
Same tests and terminal conditions as for subgroup 9, except TC = +125°C. |
" |
35 |
" |
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tPLH |
" " |
67 to 70 |
" |
35 |
" |
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11 |
Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C. |
1/ Case X and 2 pins not referenced are NC.
2/ IOS limits for CKT 8 are -15/-110 mA.
3/ IIL limits in mA are as follows:
Test |
Circuit |
|||||
A |
8 |
C |
D |
E |
F |
|
IIL |
-.12/-.36 |
-.03/-.30 |
-.15/-.38 |
-.16/-.40 |
-.15/-.38 |
-.10/-.34 |
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