MIL-M-38510-16 Microcircuits, Digital, Ttl, And Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic, silicon, TTL, positive AND logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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Test

Symbol

Conditions

-55°C ≤ TC  ≤ +125°C

unless otherwise specified

Device type

Limits

Units

Min

Max

High-level output voltage

VOH

VCC  = 4.5 V, VIN  = 2.0 V

IOH  = -800 µA for all inputs of gate under test  1/

01

2.4

V

Low-level output voltage

VOL

VCC  = 4.5 V, IOL  = 16 mA VIN  = 0.8 V for all inputs of gate under test  1/

All

0.4

V

Input clamp voltage

VIC

VCC  = 4.5 V, IIN  = -12 mA TC = 25°C

All

-1.5

V

Maximum collector cut-off current

ICEX

VCC  = 4.5 V, VIN  = 2.0 V VOH  = 5.5 V

02

250

µA

High-level input current

IIH1

VCC  = 5.5 V, VIN  = 2.4 V  2/

All

40

µA

High-level input current

IIH2

VCC  = 5.5 V, VIN  = 5.5 V  2/

All

100

µA

Low-level input current

IIL

VCC  = 5.5 V, VIN  = 0.4 V  1/

All

-0.7

-1.6

mA

Short-circuit output current

IOS

VCC  = 5.5 V  1/ 3/

01

-20

-55

mA

High-level supply current

ICCH

VCC  = 5.5 V  1/ VIN  = 5.5 V

All

21

mA

Low-level supply current

ICCL

VCC  = 5.5 V  2/ VIN  = 0 V

All

33

mA

Propagation delay time, high-to-low-level

tPHL

CL  = 50 pF, RL = 390 0

01

3

32

ns

02

3

38

ns

Propagation delay time, low-to-high-level

tPLH

CL  = 50 pF, RL = 390 0

01

3

40

ns

02

3

49

ns